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| Entry Year | 102 |
|---|---|
| Patent category | Patent |
| Patent title | 高頻特性量測之直通校正基板及其量測方法 |
| Language used in publication | 中文 |
| Patent number | I382194 |
| Patent country | ROC patent |
| Date (Year/Month) | 2013-01 |
| Patent owner | Song-Mao Wu / 吳松茂, 官聖洧 |
