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    期刊論文
    出版年份著作著作人
    2017Hong-Wun Gao, Yeong-Her Wang and Te-Kuang Chiang, "A Quasi-3-D Scaling Length Model for Trapezoidal FinFET (TzFinFET) and Its Application to Subthreshold Behavior Analysis" , IEEE Trans on nanotechnology (TNANO) , xx , xx , 2017, ppxx-xx (SCI)江德光
    2017David J.Y. Feng (馮瑞陽),, YEN-JU LIN, YUN-CHENG KU, HAN-YUN JHANG, TZY-RONG LIN, and MAO-KUEN KUO, "GaAsSb spacer effect in quasi-type-II InAs coupled-QDs for intraband absorption enhancement" , Optical Materials Express , 7 , 4 , 2017, pp1351-1364 (SCI)馮瑞陽
    2017P. H. Deng*, R. C. Liu(劉人權), W. D. Lin(林威達), and W. Lo(羅巍), "Design of a microstrip lowpass-bandpass diplexer using direct-feed coupled-resonator filter " , IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS , 27 , 3 , 2017, pp254 -256 (SCI)鄧卜華
    2017Hong-Wun Gao, Yeong-Her Wang and Te-Kuang Chiang, "A Novel Localized-Trapped-Charge-Induced Threshold Voltage Model for Double-Fin Multi-Channel FETs (DFMcFETs)" , IEEE Trans on Device and Material Reliability (TDMR) , xx , xx , 2017, ppxx-xx (SCI)江德光
    2017Chiang Te-Kuang, "A New Short-Channel-Effect-Degraded Subthrehold Behavior Model for Double-Fin Multi-Channel FETs (DFMcFETs)" , IEEE Transactions on Nanotechnology , 16 , 1 , 2017, pp16-22 (SCI)江德光
    2016Chiang Te-Kuang, "A Device-Physics-Oriented Static Noise Margin/logic swing Model for surrounding-gate MOSFET Working on Subthreshold CMOS Logic Gates" , IEEE Trans on Electron Device (TED) , 63 , 11 , 2016, pp4209-4217 (SCI)江德光
    2016Wenqi Zhang, Tzuo-Li Wang, Yan-Hua Huang, Tsu-Ting Cheng, Shih-Yao Chen, Yi-Ying Lib, Chun-Hsiang Hsu, Chih-Jui Lai, Wen-Kuan Yeh and Yi-Lin Yang, "Influence of Fin Number on Hot-Carrier Injection Stress Induced Degradation in Bulk FinFETs" , Microelectronics Reliability , 67 , 1 , 2016, pp89-93 (SCI)葉文冠
    2016Yi-He Tsai, Chen-Han Chou, An-Shih Shih, Yu-Hau Jau, Wen-Kuan Yeh, Yu-Hsien Lin, Fu-Hsiang Ko, and Chao-Hsin Chien, "Improving Thermal Stability and Interface State Density of High-k Stacks by Incorporating Hf into an Interfacial Layer on p-Germanium" , IEEE ELECTRON DEVICE LETTERS, , 37 , 11 , 2016, pp1379-1381, (SCI)葉文冠
    2016Wen-Kuan Yeh, Wenqi Zhang, Yi-Lin Yang, An-Ni Dai(戴安妮), Kehuey Wu, Tung-Huan Chou, Cheng-Li Lin, Kwang-Jow Gan, Chia-Hung Shih and Po-Ying Chen, "The Observation of Width Quantization Impact on Device Performance and Reliability for High-k/Metal Tri-Gate FinFET" , IEEE Transaction on Device and Materials Reliability , 16 , 4 , 2016, pp610-616 (SCI)葉文冠
    2016YAO-JEN LEE, GUANG-LI LUO, FU-JU HOU, MIN-CHENG CHEN, CHIH-CHAO YANG,CHANG-HONG SHEN, WEN-FA WU, JIA-MIN SHIEH, AND WEN-KUAN YEH, "Ge GAA FETs and TMD FinFETs for the Applications Beyond Si—A Review" , IEEE Journal of the Electron Devices Society , 4 , 5 , 2016, pp286-293 (SCI)葉文冠
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