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    期刊論文
    出版年份著作著作人
    2022"Hsiang-Cheh Huang @ Google Scholar" , 0 , 2022 (其他)黃祥哲
    2018Yi-Hsin Pang and Jhong-Jie Li (李仲傑), "A Planar Wideband Balanced Crossover" , IEEE TRANSACTIONS ON COMPONENTS, PACKAGING AND MANUFACTURING TECHNOLOGY , 8 , 10 , 2018, pp1807-1814 (SCI)龎一心
    2018Wen-Kuan Yeh ; Wenqi Zhang ; Po-Ying Chen ; Yi-Lin Yang, "The Impact of Fin Number on Device Performance and Reliability for Multi-Fin Tri-Gate n-and p-type FinFET" , IEEE Transaction on Device and Materials Reliability , 15 , 1 , 2018, pp1-2 (SCI)葉文冠
    2018Juin J. Liou, Te-Kuang Chiang, "A Novel Effective-Conducting-Path-Induced Scaling Length Model and Its Application for Assessing Short-Channel Performance of Multiple-Gate MOSFETs" , IEEE Trans on Electron DEvices , 65 , 10 , 2018, pp4535-4541 (SCI)江德光
    2018Chun-Lin Chu ; Kehuey Wu ; Guang-Li Luo ; Bo-Yuan Chen ; Shih-Hong Chen ; Wen-Fa Wu ; Wen-Kuan Yeh, "Stacked Ge-Nanosheet GAAFETs Fabricated by Ge/Si Multilayer Epitaxy" , IEEE ELECTRON DEVICE LETTERS , 39 , 8 , 2018, pp1133-1136 (SCI)葉文冠
    2018Hong-Wun Gao, Yeong-Her Wang and Te-Kuang Chiang, "A New Device-Parameter-Oriented DC Power Model for Symmetric Operation of Junctionless Double-Gate MOSFET Working on Low-Power CMOS Subthreshold Logic Gates" , IEEE Trans on Nanotechnology , 17 , 2 , 2018, pp424-431 (SCI)江德光
    2018Juin J. Liou, Hong-Wun Gao, Yeong-Her Wang and Te-Kuang Chiang, "A Unified Quasi-3D Subthreshold Behavior Model for Multiple-Gate MOSFETs" , IEEE Trans on Nanotechnology , 16 , 2 , 2018, pp281-289 (SCI)江德光
    2018P. H. Deng, W. Lo(羅巍), B. L. Chen(陳博霖), and C. H. Lin(林振祥), "Designs of diplexing power dividers" , IEEE Access , Volume: 6 , xx , 2018, pp3872-3881 (SCI)鄧卜華
    2018Ren-Fang Hsu(許仁芳), Meng-Hua Tu(杜孟樺), Sung-Mao Wu, Chun-Sen Wu, Yung-Mao Cheng and et, "Novel Testing Method for Signal Coupling and Discontinued Noise by Near-Field Measurement system. " , ICIC Express Letters, Part B: Applications , 9 , 1 , 2018, ppN-N (EI)吳松茂
    2018Wen-Teng Chang; Cheng-Ting Shih(施政廷); Jhao-Lin Wu(吳昭霖); Shih-Wei Lin(林士瑋); Wen-Kuan Yeh, "Back-biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs" , IEEE Transactions on Nanotechnology , 17 , 1 , 2018, pp36-40 (SCI)張文騰
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