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    出版年份著作著作人
    2018Wen-Teng Chang; Cheng-Ting Shih(施政廷); Jhao-Lin Wu(吳昭霖); Shih-Wei Lin(林士瑋); Wen-Kuan Yeh, "Back-biasing to Performance and Reliability Evaluation of UTBB FDSOI, Bulk FinFETs, and SOI FinFETs" , IEEE Transactions on Nanotechnology , 17 , 1 , 2018, pp36-40 (SCI)張文騰
    2017Hong-Wun Gao, Yeong-Her Wang and Te-Kuang Chiang, "A Quasi-3-D Scaling Length Model for Trapezoidal FinFET (TzFinFET) and Its Application to Subthreshold Behavior Analysis" , IEEE Trans on nanotechnology (TNANO) , 16 , 2 , 2017, pp281-289 (SCI)江德光
    2017Wen-Teng Chang; Cheng-Ting Shih; Jhao-Lin Wu(吳昭霖); Shih-Wei Lin(林士瑋), and Wen-Kuan Yeh, "Performance Evaluation of UTBB FDSOI, FinFETs, and SOI FinFETs via Mechanical Stresses and Body Biasing" , IEEE Transactions on Nanotechnology , None , 99 , 2017, pp1-1 (SCI)葉文冠
    2017 Chen-Han Chou ; Yi-He Tsai ; Chung-Chun Hsu ; Yu-Hau Jau ; Yu-Hsien Lin ; Wen-Kuan Yeh ; Chao-Hsin Chien, "Experimental Realization of Thermal Stability Enhancement of Nickel Germanide Alloy by Using TiN Metal Capping" , IEEE Transactions on Electron Devices , 64 , 5 , 2017, pp 2314- 2320 (SCI)葉文冠
    2017David J.Y. Feng (馮瑞陽),, YEN-JU LIN, YUN-CHENG KU, HAN-YUN JHANG, TZY-RONG LIN, and MAO-KUEN KUO, "GaAsSb spacer effect in quasi-type-II InAs coupled-QDs for intraband absorption enhancement" , Optical Materials Express , 7 , 4 , 2017, pp1351-1364 (SCI)馮瑞陽
    2017P. H. Deng*, R. C. Liu(劉人權), W. D. Lin(林威達), and W. Lo(羅巍), "Design of a microstrip lowpass-bandpass diplexer using direct-feed coupled-resonator filter " , IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS , 27 , 3 , 2017, pp254 -256 (SCI)鄧卜華
    2017Hong-Wun Gao, Yeong-Her Wang and Te-Kuang Chiang, "A Novel Localized-Trapped-Charge-Induced Threshold Voltage Model for Double-Fin Multi-Channel FETs (DFMcFETs)" , IEEE Trans on Device and Material Reliability (TDMR) , 17 , 2 , 2017, pp291-297 (SCI)江德光
    2017Chiang Te-Kuang, "A New Short-Channel-Effect-Degraded Subthrehold Behavior Model for Double-Fin Multi-Channel FETs (DFMcFETs)" , IEEE Transactions on Nanotechnology , 16 , 1 , 2017, pp16-22 (SCI)江德光
    2016Chiang Te-Kuang, "A Device-Physics-Oriented Static Noise Margin/logic swing Model for surrounding-gate MOSFET Working on Subthreshold CMOS Logic Gates" , IEEE Trans on Electron Device (TED) , 63 , 11 , 2016, pp4209-4217 (SCI)江德光
    2016Wenqi Zhang, Tzuo-Li Wang, Yan-Hua Huang, Tsu-Ting Cheng, Shih-Yao Chen, Yi-Ying Lib, Chun-Hsiang Hsu, Chih-Jui Lai, Wen-Kuan Yeh and Yi-Lin Yang, "Influence of Fin Number on Hot-Carrier Injection Stress Induced Degradation in Bulk FinFETs" , Microelectronics Reliability , 67 , 1 , 2016, pp89-93 (SCI)葉文冠

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