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    出版年份著作著作人
    1990Pei-Yung Hsiao and Wu-Shiung Feng, "Using Multiple Storage Quad Tree on a Hierarchical VLSI Compaction Scheme" , IEEE Trans. Computer-Aided Design of Integrated Circuits and Systems , 9 , 5 , 1990, pp522-536 (SCI)蕭培墉
    1990Pei-Yung Hsiao and Wu-Shiung Feng, "New Algorithms Based on Multiple Storage Quadtrees in Hierarchical Compaction of VLSI Mask Layout" , Int. J. of Computer-Aided Design , 22 , 2 , 1990, pp74-80 (SCI)蕭培墉
    1990Pei-Yung Hsiao, S. F. Steven Chen, and Wu-Shiung Feng, "A New Control Strategy for An A.I. Approach to VLSI Layout Compaction" , INTEGERATION, the VLSI journal , 10 , 1 , 1990, pp55-70 (SCI)蕭培墉
    1989Pei-Yung Hsiao, Wu-Shiung Feng and S. F. Steven Chen, "An Application of Expert System in Layout Compaction of VLSI Design" , Journal of the Chinese Inst. of Engineers , 12 , 4 , 1989, pp497-510 (SCI)蕭培墉
    1989Pei-Yung Hsiao and Wu-Shiung Feng, "Using Hierarchical M. S. Quad Tree on A Constraint-Graph Layout Compaction" , Journal of the Chinese Inst. of Engineers , 12 , 3 , 1989, pp301-315 (SCI)蕭培墉
     Wen-Teng Chang; Cheng-Ting Shih; Jhao-Lin Wu(吳昭霖); Shih-Wei Lin(林士瑋), and Wen-Kuan Yeh, "Performance Evaluation of UTBB FDSOI, FinFETs, and SOI FinFETs via Mechanical Stresses and Body Biasing" , IEEE Transactions on Nanotechnology , PP , 99 , 0000, pp1-1 (SCI)葉文冠
     Wen-Teng Chang; Cheng-Ting Shih; Jhao-Lin Wu(吳昭霖); Shih-Wei Lin(林士瑋), and Wen-Kuan Yeh, "Performance Evaluation of UTBB FDSOI, FinFETs, and SOI FinFETs via Mechanical Stresses and Body Biasing" , IEEE Transactions on Nanotechnology , PP , 99 , 0000, pp1-1 (SCI)葉文冠
     Cheng-Yi Chen, Siou-Mei Huang, I-Chun Lin, Cheng-Fu Yang, Sung-Mao Wu (吳松茂), Yuan-Tai Hsieh, "Growth of Fe2O3 Thin Films and Fe2O3-Doped ZnO Micron-Flower by Using Modified Spray Coating Method" , Taylor & Francis Group, 2015. , 0000 (EI)吳松茂
     Chien-Chen Diao, Chia-I Chuang, Siou-Mei Huang, Cheng-Fu Yang, Sung-MaoWu(吳松茂),, "Deposition of In2O3-Al2O3-SnO2 (IATO) Transparent Conduction Thin Films by Using Spray Coating Method" , Taylor & Francis Group, 2015. , 0000 (EI)吳松茂
     Wen-Teng Chang,Li-Gong Cin, Wen-Kuan Yeh, "Impact of Fin Width and Back Bias Under Hot Carrier Injection on Double-Gate FinFETs" , IEEE Transaction on Device and Materials Reliability , 12 , 3 , 0000, pp1-4 (SCI)葉文冠

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