"Trap Induced Negative Differential Conductance and Back-Gated Charge Redistribution in AlGaN/GaN Power Devices" , Microelectronics Reliability , 102 , 113495 , pp89-93 ,2019, (SCI)

出版日期 2019-09-02 期刊等級 SCI 論文名稱(篇名) Trap Induced Negative Differential Conductance and Back-Gated Charge Redistribution in AlGaN/GaN Power Devices 期刊名 Microelectronics Reliability 卷數 102 期數 113495 起頁 89 迄頁 93 總頁數 5 作者中文名 葉文冠 作者英文名 Wen-Kuan Yeh 全部作者 Andrew T. Binder , Jiann-Shiun Yuan ,Balakrishnan Krishnan , Patrick M. Shea , and Wen-Kuan Yeh 著作人數 5 作者型態 Other