出版日期:2016-09-00
期刊等級:SCI
論文名稱(篇名):Improving Thermal Stability and Interface State Density of High-k Stacks by Incorporating Hf into an Interfacial Layer on p-Germanium
期刊名:IEEE ELECTRON DEVICE LETTERS,
卷數:37
期數:11
起頁:1379
迄頁:1381
總頁數:3
作者中文名:葉文冠
作者英文名:Wen-Kuan Yeh
全部作者:Yi-He Tsai, Chen-Han Chou, An-Shih Shih, Yu-Hau Jau, Wen-Kuan Yeh, Yu-Hsien Lin, Fu-Hsiang Ko, and Chao-Hsin Chien
著作人數:8
作者型態:Otherr