出版日期:2015-06-00
期刊等級:SCI
論文名稱(篇名):A Si–based bulk FinFET by novel etching process with mask–less and photoresist–free lithography technique
期刊名:International Journal of Nanotechnology
卷數:12
期數:1/2
起頁:1/2
迄頁:89
作者中文名:葉文冠
作者英文名:Wen-Kuan Yeh
全部作者:Min–Cheng Chen, Chih–Ming Wu, Yun–Fang Hou, Yi–Ju Chen, Chang–Hsien Lin, Chia–Yi Lin, Bo–Wei Wu, Wen–Kuan Yeh
著作人數:8
作者型態:Corresponding Author