"The Impact of Junction Doping Distribution on Device Performance Variability and Reliability for Fully Depleted Silicon on Insulator with Thin BOX Layer MOSFETs" , IEEE Transactions on Nanotechnology , 14 , 2 , pp1536-1550 ,2015, (SCI)

  • 出版日期：2015-04-00
  • 期刊等級：SCI
  • 論文名稱(篇名)：The Impact of Junction Doping Distribution on Device Performance Variability and Reliability for Fully Depleted Silicon on Insulator with Thin BOX Layer MOSFETs
  • 期刊名：IEEE Transactions on Nanotechnology
  • 卷數：14
  • 期數：2
  • 起頁：1536
  • 迄頁：1550
  • 作者中文名：葉文冠
  • 作者英文名：Wen-Kuan Yeh
  • 全部作者：Wen-Kuan Yeh, Cheng-Li Lin, Tung-Huan Chou, Kehuey Wu, Jiann-Shiun Yuan
  • 著作人數：5
  • 作者型態：First Author