"Reliability of the Doping Concentration in an Ultra-thin Body and Buried Oxide Silicon on Insulator (SOI) and Comparison with a Partially Depleted SOI" , Microelectronics Reliability , 54 , 2 , pp485-489 ,2014, (SCI)

  • 出版日期：2014-07-00
  • 期刊等級：SCI
  • 論文名稱(篇名)：Reliability of the Doping Concentration in an Ultra-thin Body and Buried Oxide Silicon on Insulator (SOI) and Comparison with a Partially Depleted SOI
  • 期刊名：Microelectronics Reliability
  • 卷數：54
  • 期數：2
  • 起頁：485
  • 迄頁：489
  • 作者中文名：葉文冠
  • 作者英文名：Wen-Kuan Yeh
  • 全部作者：W. T. Chang, C. M. Lai , W. K. Yeh
  • 著作人數：3
  • 作者型態：Other