"The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions" , Active and Passive Electronic Components , 2012 , Article ID 872494 , pp.-. ,2012, (EI)

  • 出版日期：2012-04-00
  • 期刊等級：EI
  • 論文名稱(篇名)：The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions
  • 期刊名：Active and Passive Electronic Components
  • 卷數：2012
  • 期數：Article ID 872494
  • 起頁：.
  • 迄頁：.
  • 作者中文名：葉文冠
  • 作者英文名：Wen-Kuan Yeh
  • 全部作者：Yi-Lin Yang, Wenqi Zhang, Chi-Yun Cheng and Wen-kuan Yeh
  • 著作人數：4