"Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-κ Dielectric nMOSFETs" , IEEE Transactions on Electron Devices , 58 , 3 , pp812-818 ,2011, (SCI),(EI)

  • 出版日期：2011-03-00
  • 期刊等級：SCI / EI
  • 論文名稱(篇名)：Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-κ Dielectric nMOSFETs
  • 期刊名：IEEE Transactions on Electron Devices
  • 卷數：58
  • 期數：3
  • 起頁：812
  • 迄頁：818
  • 總頁數：7
  • 作者中文名：葉文冠
  • 作者英文名：Wen-Kuan Yeh
  • 全部作者：Yu-Ting Chen, Kun-Ming Chen,Cheng-Li Lin, Wen-Kuan Yeh,Guo-Wei Huang, Chien-Ming Lai, Yi-Wen Chen, Che-Hua Hsu, and Fon-Shan Huang
  • 著作人數：9
  • 作者型態：Other
  • 使用語言：英文