"Device Characteristicsof Nano Scale Junctionless Accumulation Mode FET (JAM-FET) with Localized Anti-channel Doping",Solid-State Device and Materials,Japan, (SCI)

  • 年度：2018
  • 論文類型：會議論文
  • 論文等級：SCI
  • 論文名稱(篇名)：Device Characteristicsof Nano Scale Junctionless Accumulation Mode FET (JAM-FET) with Localized Anti-channel Doping
  • 會議名稱：Solid-State Device and Materials
  • 作者中文名：葉文冠
  • 作者英文名：Wen-Kuan Yeh
  • 全部作者：Huang,Peng Chen, Yung-Ning Tu, Srivatsa Srinivasa, Vijaykrishnan Narayanan3, Meng-Fan Chang, and Wen-Kuan Yeh1Cheng-Li Lin,a, Jian-Dong Lee, Yao-Jen Lee,Yu-Jiun Lu, Wen-Kuan Yeh, Tsung-Kuei Kang, Pi-Chun Juan, Yu-Zhang Zhu, and Tai-Yin Lin
  • 著作人數：16
  • 作者型態：Other
  • 會議地點：Japan