"A Novel Effective-Conducting-Path-Induced Scaling Length Model and Its Application for Assessing Short-Channel Performance of Multiple-Gate MOSFETs" , IEEE Trans on Electron DEvices , 65 , 10 , pp4535-4541 ,2018, (SCI)

  • 出版日期：2018-08-00
  • 期刊等級：SCI
  • 論文名稱(篇名)：A Novel Effective-Conducting-Path-Induced Scaling Length Model and Its Application for Assessing Short-Channel Performance of Multiple-Gate MOSFETs
  • 期刊名：IEEE Trans on Electron DEvices
  • 卷數：65
  • 期數：10
  • 起頁：4535
  • 迄頁：4541
  • 總頁數：7
  • 作者中文名：江德光
  • 作者英文名：Te-Kung Chiang
  • 全部作者：Juin J. Liou, Te-Kuang Chiang
  • 著作人數：2
  • 作者型態：Corresponding Author