"A New Analytical Model for Short Channel Fully Depleted DualMaterial Gate Silicon on Insulator Metal-Oxide Semiconductor Field-Effect Transistors" , Japanese Journal of Applied Physics , vol.47 , no.7 , pp1022-1027 ,2010, (SCI)
出版日期:2010-04-00
期刊等級:SCI
論文名稱(篇名): Japanese Journal of Applied Physics
期刊名:IEEE Electron Device Letters
卷數:vol. 47
期數:no.7
起頁:1022
迄頁:1027
總頁數:6
作者中文名:江德光
作者英文名:Te-Kung Chiang
全部作者:T.K. Chiang
著作人數:1
作者型態:First Author / Corresponding Author
使用語言:英文