A Novel Effective-Conducting-Path-Induced Scaling Length Model and Its Application for Assessing Short-Channel Performance of Multiple-Gate MOSFETs
- 年度：2018
- 論文類型：海報展示
- 論文等級：其他
- 論文名稱(篇名)：A Novel Effective-Conducting-Path-Induced Scaling Length Model and Its Application for Assessing Short-Channel Performance of Multiple-Gate MOSFETs
- 會議名稱：International Electron Devices & Materials Symposium 2018
- 會議開始時間：2018-11-14
- 會議結束時間：2018-11-16
- 作者中文名：江德光
- 作者英文名：Te-Kung Chiang
- 全部作者：Te-Kuang Chiang, Yu-Huang Lin (林祐萱), Chia-Ling Young (楊佳琳)
- 著作人數：3
- 作者型態：First Author / Corresponding Author
- 會議地點：Keelung, Taiwan
- 使用語言：英文