"Junctionless Multiple-Gate (JLMG) MOSFETs: A Unified Subthreshold Current Model to Assess Noise Margin of Subthreshold Logic Gate” IEEE Trans. on Electron Device Vol. 65, No. 10, pp. 4535-4541, October, 2021.

T.K. Chiang,” Junctionless Multiple-Gate (JLMG) MOSFETs: A Unified Subthreshold Current Model to Assess Noise Margin of Subthreshold Logic Gate” IEEE Trans. on Electron Device Vol. 65, No. 10, pp. 4535-4541, October, 2021.