Wen-Teng Chang, Chia-Chang Yang, Yueh-Ting Ho, Ching-Lun Wang and Wei-I Shen, “Electrical Stress on the CMOS Inverters Made by Junctionless Gate-all-around Transistors,” IEEE Transactions on Electron Devices, 71, 5, 2863

Wen-Teng Chang, Chia-Chang Yang, Yueh-Ting Ho, Ching-Lun Wang and Wei-I Shen, “Electrical Stress on the CMOS Inverters Made by Junctionless Gate-all-around Transistors,” IEEE Transactions on Electron Devices, 71, 5, 2863 - 2868, 2024. (SCI)

Wen-Teng Chang, Chia-Chang Yang, Yueh-Ting Ho, Ching-Lun Wang and Wei-I Shen, “Electrical Stress on the CMOS Inverters Made by Junctionless Gate-all-around Transistors,” IEEE Transactions on Electron Devices, 71, 5, 2863 - 2868, 2024. (SCI)