” A unified Ballistic Model for the Subthreshold Behavior of multiple-gate MOSFETs”, IEEE International Conference on Solid-State and Integrated Circuits Technology, Oct 22-25, 2022 (ICSICT2024). Zhuhai, China.

T.K. Chiang, Ching-Ta Lin, Yu-Xian Liu, Jhao-Wei Lin, and Kai-Bin Chen,” A unified Ballistic Model for the Subthreshold Behavior of multiple-gate MOSFETs”, IEEE International Conference on Solid-State and Integrated Circuits Technology, Oct 22-25, 2022 (ICSICT2024). Zhuhai, China.