友善列印 - Chang-Yeh Hsieh; Ling-Shen Tseng; Yi-Han Chen; Chiung-Hui Tsai; Chih-Hung Wu, "Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based"

Chang-Yeh Hsieh; Ling-Shen Tseng; Yi-Han Chen; Chiung-Hui Tsai; Chih-Hung Wu, "Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based"

Chang-Yeh Hsieh; Ling-Shen Tseng; Yi-Han Chen; Chiung-Hui Tsai; Chih-Hung Wu, Deep-Learning Methods for Defect Inspection of Plated Through Holes With Clustering-Based, IEEE Access, Vol. 12, pp. 190598-190610