"AC Impedance Compared to DC Characterization for Source-Drain Resistance in Junctionless Gate-All-Around MOSFETs” IEEE Journal of the Electron Devices Society, vol. 13, no. Y, pp. 963–968, Aug. 2025. (SCI)

Hung-Hsi Chen (陳泓熙), Ching-Lun Wang (王靖侖), Yao-Jen Lee, Wen-Teng Chang* "AC Impedance Compared to DC Characterization for Source-Drain Resistance in Junctionless Gate-All-Around MOSFETs” IEEE Journal of the Electron Devices Society, vol. 13, no. Y, pp. 963–968, Aug. 2025. (SCI)