友善列印 - Wen-Teng Chang, Liang-I. Cai, Hung-Hsi Chen,Jen-Chien Li, and Yao-Jen Lee, “Hot Carrier Stress in Junctionless Gate-all-around nMOSFETs under Different Bias Conditions,” Solid-State Electronics, vol. 229, Nov. 2025, Art. no. 109187. (SCI)

Wen-Teng Chang, Liang-I. Cai, Hung-Hsi Chen,Jen-Chien Li, and Yao-Jen Lee, “Hot Carrier Stress in Junctionless Gate-all-around nMOSFETs under Different Bias Conditions,” Solid-State Electronics, vol. 229, Nov. 2025, Art. no. 109187. (SCI)

Wen-Teng Chang, Liang-I. Cai (蔡糧屹), Hung-Hsi Chen (陳泓熙),
Jen-Chien Li (李任健), and Yao-Jen Lee, “Hot Carrier Stress in Junctionless
Gate-all-around nMOSFETs under Different Bias Conditions,” Solid-State
Electronics, vol. 229, Nov. 2025, Art. no. 109187. (SCI)