"Impact of Strain on Hot Electron Reliability of Dual-Band Power Amplifier and Integrated LNA-Mixer RF Performances" , Microelectronics Reliability , 50 , 6 , pp807-812 ,2010, (SCI)

出版日期：2010-06-00

期刊等級：SCI

論文名稱(篇名)：Impact of Strain on Hot Electron Reliability of Dual-Band Power Amplifier and Integrated LNA-Mixer RF Performances

期刊名：Microelectronics Reliability

卷數：50

期數：6

起頁：807

迄頁：812

總頁數：6

作者中文名：葉文冠

作者英文名：Wen-Kuan Yeh

全部作者：J.S. Yuan, J. Ma, C.W. Hsu, and Wen-Kuan Yeh

著作人數：4

作者型態：Corresponding Author

使用語言：英文

Click Num: