"Effects of Fin Width on Device Performance and Reliability of Double-Gate n-Type FinFETs" , IEEE TRANSACTIONS ON ELECTRON DEVICES , 60 , 11 , pp3639-3644 ,2013, (SCI)

出版日期：2013-11-00

期刊等級：SCI

論文名稱(篇名)：Effects of Fin Width on Device Performance and Reliability of Double-Gate n-Type FinFETs

期刊名：IEEE TRANSACTIONS ON ELECTRON DEVICES

卷數：60

期數：60

起頁：3639

迄頁：3644

作者中文名：葉文冠

作者英文名： Wen-Kuan Yeh

全部作者：Cheng-Li Lin, Po-Hsiu Hsiao, Wen-Kuan Yeh, Han-Wen Liu, Syuan-Ren Yang, Yu-Ting Chen, Kun-Ming Chen,and Wen-Shiang Liao

著作人數：8

作者型態：Other

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