"Reliability Analysis of pHEMT Power Amplifier with an On-chip Linearizer" , Microelectronics Reliability , 6 , 53 , pp878-884 ,2013, (SCI)

出版日期：2013-06-00

期刊等級：SCI

論文名稱(篇名)：Reliability Analysis of pHEMT Power Amplifier with an On-chip Linearizer

期刊名：Microelectronics Reliability

卷數：6

期數：53

起頁：878

迄頁：884

作者中文名：葉文冠

作者英文名：Wen-Kuan Yeh

全部作者：Jiann-Shiun Yuan, Hsu-Der Yen, Guo-Wei Huang, and Wen-Kuan Yeh

著作人數：7

作者型態 Corresponding Author

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