"The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions" , Active and Passive Electronic Components , 2012 , Article ID 872494 , pp.-. ,2012, (EI)
出版日期：2012-04-00
期刊等級：EI
論文名稱(篇名)：The Improvement of Reliability of High-k/Metal Gate pMOSFET Device with Various PMA Conditions
期刊名：Active and Passive Electronic Components
卷數：2012
期數：Article ID 872494
起頁：.
迄頁：.
作者中文名：葉文冠
作者英文名：Wen-Kuan Yeh
全部作者：Yi-Lin Yang, Wenqi Zhang, Chi-Yun Cheng and Wen-kuan Yeh
