張文騰/研討會

日期	標題
2025-09-10	“Hot Carrier Stress in Junctionless Gate-all-around nMOSFETs under Different Bias Conditions,” 24th Conference on Insulating Films on Semiconductors, 2025 June 24-27, Granada, Spain.
2020-06-02	Wen Teng Chang, Po-Heng Pao,"Air-Channel Transistors with Coplanar Gates",ICEEI,Hong Kong,2019/06/15-2019/06/17 (其他)
2020-06-02	"Electrical Characterization of Extended Fins by Using Wire- Bonded FinFETs",," IEEE XXV International Conference on Electronics, Electrical Engineering and Computing – INTERCON,利馬,祕魯,2018/08/08 (其他)
2020-06-02	Wen-Teng Chang, Jhao-Lin Wu (吳昭霖), Yen-Chieh Huang(黃彥傑),"Back Biasing on n-/ p- Type Ultra-Thin Body and Buried Oxide Fully Depleted Silicon-on-Insulator",國際工程與應用科學會議,曼谷,2018/02/22-2018/02/24 (其他)
2020-06-02	許祖榮，張文騰，辛柏葳,"吸熱物質對於熱電元件的溫室貢獻",2017光電與通訊工程應用研討會,高雄,2017/11/24 (其他)
2020-06-02	何俞彥，辛柏葳，張文騰，林士瑋，葉文冠,"以打線延長量化寬度之鰭式場效電晶體",2017光電與通訊工程應用研討會,高雄,2017/11/24-2017/11/14 (其他)
2020-06-02	Wen-Teng Chang, Yu-Yen Ho(何俞彥), Shih-Wei Lin(林士瑋), Shang-Min, Li(李尚閔),"Characterization of Extended Quantized Width FinFETs",International Electron Devices and Materials Symposium (IEDMS),Taipei,2016/11/24-2016/11/25 (其他)
2020-06-02	Wen-Teng Chang, Shih-Wei Lin(林士瑋), Wen-Kuan Yeh,"Electrical Gate and Mechanical Stresses on <110> and <100> n-Type FinFETs",International Electron Devices and Materials Symposium (IEDMS),Taipei,2016/11/24-2016/11/25 (其他)
2020-06-02	Wen-Teng Chang, Shih-Wei Lin(林士瑋), Cheng-Ting Shih(施政廷), Wen-Kuan Yeh,"Back Bias Modulation of UTBB FDSOI, Bulk FinFET, and SOI FinFET",The 7th IEEE International Nanoelectronics Conference,Chengdu, China,2016/05/09-2016/05/11 (其他)
2020-06-02	"Temperature Coefficient of Resistance Related to Amorphous Siliocn/Metal Contact Design of Microbolometers",3rd IEEE International Conference on Devices, Circuits and Systems (ICDCS),Coimbatore, India,2016/03/03-2016/03/05 (其他)