"A Quasi-3-D Scaling Length Model for Trapezoidal FinFET (TzFinFET) and Its Application to Subthreshold Behavior Analysis" , IEEE Trans on nanotechnology (TNANO) , 16 , 2 , pp281-289 ,2017, (SCI)

出版日期2017-12-00 期刊等級SCI 論文名稱(篇名)A Quasi-3-D Scaling Length Model for Trapezoidal FinFET (TzFinFET) and Its Application to Subthreshold Behavior Analysis 期刊名IEEE Trans on nanotechnology (TNANO) 卷數16 期數2 起頁281 迄頁289 總頁數9 作者中文名江德光作者英文名Te-Kung Chiang 全部作者Hong-Wun Gao, Yeong-Her Wang and Te-Kuang Chiang 著作人數3 作者型態Corresponding Author 使用語言英文

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