Te-Kuang Chiang,Yu-Ting Zhong, Yu-Yang Lin, Jhao-Wei Lin, Kai-Bin Chen , Yuan-Ju Tien, and Fang-Yu Ye,” A New Interface Quasi-Fermi Potential Model for Interface-Trapped-Charge GAA FET and Its Application to Examine the Degraded Noise Margin of Subthreshold Logic”, IEEE 30th International Symposium on the physical and failure analysis of integrated circuits (IPFA), July 2023, Penang, Malaysia.