"Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-κ Dielectric nMOSFETs" , IEEE Transactions on Electron Devices , 58 , 3 , pp812-818 ,2011, (SCI),(EI)

出版日期：2011-03-00

期刊等級：SCI / EI

論文名稱(篇名)：Effect of NH3 Plasma Nitridation on Hot-Carrier Instability and Low-Frequency Noise in Gd-Doped High-κ Dielectric nMOSFETs

期刊名：IEEE Transactions on Electron Devices

卷數：58

期數：3

起頁：812

迄頁：818

總頁數：7

作者中文名：葉文冠

作者英文名：Wen-Kuan Yeh

全部作者：Yu-Ting Chen, Kun-Ming Chen,Cheng-Li Lin, Wen-Kuan Yeh,Guo-Wei Huang, Chien-Ming Lai, Yi-Wen Chen, Che-Hua Hsu, and Fon-Shan Huang

著作人數：9

作者型態：Other

使用語言：英文

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