"The Investigation of Post-Annealing-Induced Defects Behavior on 90-nm In Halo nMOSFETs With Low-Frequency Noise and Charge-Pumping Measuring" , IEEE Electron Device Letters , 28 , 2 , pp142-144 ,2007, (SCI),(EI)
出版日期：2008-02-00
期刊等級：SCI / EI
論文名稱(篇名)：The Investigation of Post-Annealing-Induced Defects Behavior on 90-nm In Halo nMOSFETs With Low-Frequency Noise and Charge-Pumping Measuring
期刊名：IEEE Electron Device Letters
卷數：28
期數：2
起頁：142
迄頁：144
總頁數：3
作者中文名：葉文冠
作者英文名：Wen-Kuan Yeh
全部作者：Chieh-Ming Lai, Yean-Kuen Fang, Wen-Kuan Yeh, Chien-Ting Lin, and T. H. Chou
