"Device Characteristicsof Nano Scale Junctionless Accumulation Mode FET (JAM-FET) with Localized Anti-channel Doping",Solid-State Device and Materials,Japan, (SCI)

年度：2018

論文類型：會議論文

論文等級：SCI

論文名稱(篇名)：Device Characteristicsof Nano Scale Junctionless Accumulation Mode FET (JAM-FET) with Localized Anti-channel Doping

會議名稱：Solid-State Device and Materials

作者中文名：葉文冠

作者英文名：Wen-Kuan Yeh

全部作者：Huang,Peng Chen, Yung-Ning Tu, Srivatsa Srinivasa, Vijaykrishnan Narayanan3, Meng-Fan Chang, and Wen-Kuan Yeh1Cheng-Li Lin,a, Jian-Dong Lee, Yao-Jen Lee,Yu-Jiun Lu, Wen-Kuan Yeh, Tsung-Kuei Kang, Pi-Chun Juan, Yu-Zhang Zhu, and Tai-Yin Lin

著作人數：16

作者型態：Other

會議地點：Japan

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友善列印