"A Novel Effective-Conducting-Path-Induced Scaling Length Model and Its Application for Assessing Short-Channel Performance of Multiple-Gate MOSFETs" , IEEE Trans on Electron DEvices , 65 , 10 , pp4535-4541 ,2018, (SCI)

出版日期：2018-08-00

期刊等級：SCI

論文名稱(篇名)：A Novel Effective-Conducting-Path-Induced Scaling Length Model and Its Application for Assessing Short-Channel Performance of Multiple-Gate MOSFETs

期刊名：IEEE Trans on Electron DEvices

卷數：65

期數：10

起頁：4535

迄頁：4541

總頁數：7

作者中文名：江德光

作者英文名：Te-Kung Chiang

全部作者：Juin J. Liou, Te-Kuang Chiang

著作人數：2

作者型態：Corresponding Author

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