"A New Short-Channel-Effect-Degraded Subthrehold Behavior Model for Double-Fin Multi-Channel FETs (DFMcFETs)" , IEEE Transactions on Nanotechnology , 16 , 1 , pp16-22 ,2017, (SCI)
出版日期：2017-01-00
期刊等級：SCI
論文名稱(篇名)：A New Short-Channel-Effect-Degraded Subthrehold Behavior Model for Double-Fin Multi-Channel FETs (DFMcFETs)
